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Adelphi Technology Inc.
2003 E. Bayshore Road
Redwood City, CA 94063

Tel: +1 (650) 474 2750
Fax: +1 (650) 474 2755
Email: info@adelphitech.com

Adelphi Neutron Optics

Neutron Optics

Magnetic Compound Refactive Lenses

The Adelphi magnetic compound refractive lens (MCRL) is designed to collect, focus, and image cold neutrons. The MCRL is comprised of a stack of 10 annular, NdFeB permanent magnetic lenses, which are radially magnetized, and alternate in polarity from lens to lens. This MCRL has a large aperture (up to 1 inch diameter), and provides focused or imaged, spin-polarized neutrons. The MCRL is useful optic for such applications as small angle scatter (SANS), reflectometry, and microscopy. Adelphi designs and fabricates the MCRL for beam lines at reactor and spallation and neutron sources. Dr. Ted Cremer, chief scientist can design and fabricate custom magnetic neutron lenses for customer applications, which include (1) neutron focusing and imaging, (2) neutral atom and light ion beam focusing, imaging, and trapping, and (3) high energy charged particle (e.g. electron, positron, and proton) focusing and imaging.

delayed gamma ray spectrum

HiTc-Wollaston Prism

Spin Echo Scattering Angle MEasurement (SESAME) has been developed by researchers to examine larger structures in the 10nm to 20 micron range.  One method uses Adelphi’s HiTc-Wollaston prism, which is under development in collaboration with Indiana University. The Wollaston prism will soon be available for custom applications on high performance neutron beam line instruments at research reactor and spallation facilities.

A SESAME instrument uses matched pairs of HiTc-Wollaston prisms to provide the precisely cancelling neutron spin precession, which is needed for spin echo angle encoding, and uses high temperature superconducting materials to achieve high magnetic fields and dimensional precision. As a result, the HiTc-Wollaston prism is expected to obtain accurate structural measurements for a wider range of sample correlation length scales (10 nm to 20 micron) for a larger range of sample sizes with more efficiency and detail than SANS and existing SESAME instruments.